| How to find the wavelength dispersion formula of the three-dimensional refractive index |
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| Measurement method of wavelength dependence of photoelasticity coefficient |
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| Changes in the polarizing plate transmission axis depending on the incident angle and azimuth (actual measurement and approximation formula) |
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| Changes in ellipticity and elliptic azimuth due to the bonding angle of polarizing plate + retardation plate (comparison between measured and calculated values) |
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| Changes in ellipticity and elliptic azimuth with respect to incident angle at 45 ° orientation of polarizing plate + retardation plate R50 (actual measurement) |
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| Re distribution measurement around the heat source placed on the film |
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| Changes in ellipticity and elliptic azimuth when a tensile load is applied to a circularly polarizing plate (actual measurement) |
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| Changes in ellipticity and elliptic azimuth due to the temperature of the circularly polarizing plate (actual measurement) |
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| Re change due to temperature of various films (actual measurement) |
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| Method for manufacturing a wideband circularly polarizing plate under the condition of an incident angle of 45 ° |
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| Experiment to compensate STN cell with two PC phase difference plates |
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| Linearly polarized light conversion experiment using three retardation plates with a retardation of 100 nm |
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| Re measurement of polarizing plate in the near infrared region |
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| Re change due to the temperature of the polarizing plate (near infrared) |
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| Re / change of orientation angle with respect to incident angle / azimuth of retardation plate (actual measurement) |
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| Tilt angle calculation example |
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| Measurement example of total internal reflection mirror using KOBRA-WPR |
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| Measurement example of half mirror using KOBRA-WPR |
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| Evaluation of fluctuations in the MD direction using KOBRA-WFD |
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| Evaluation of glass plate AR coating |
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| Effect of protective film on polarizing plate |
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| Width profile measurement of phase difference of stretched film |
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