Products(Retardation measuring device)

Retardation/Elliptical polarization measuring system

■Features
Meas. method
Parallel Nicol's rotaly method
Rotating polarizer method
Spectrometer in Parallel Nicol's rotaly method

Meas. wavelength
450、500、550、590、630、680nm
400-800nm(Spectrometer)

Sample size
Vertical incidence mesurement: 30mm square min.
Incident angle dependency: 30mm square to 30x50 mm,t3 max

Meas. area
33mm^2(Photo detecter size 5.8mm square)
φ0.8mm(Spectrometer)

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